MAXXI 6 - Coating thickness analyser

Mã sản phẩm:

Coating thickness measurement, based on X-ray fluorescence (XRF), is a widely accepted and industry-proven analytical technique, offering easy to use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analysing solids or liquids over a wide element range from 13Al to 92U on the periodic table.

With superior resolution and high efficiency SDD, the MAXXI 6 is the ideal instrument for measuring the thinnest coatings and element composition at trace level.

Key features

  • Micro-focus Be window X-ray tube combines high precision, short measurement time with field-proven high reliability, outstanding product life expectancy and low cost of ownership
  • Superior resolution Silicon Drift Detector (SDD) offers optimal efficiency at all energy levels with improved limits of detection (LOD)
  • Multi collimator optimizes flux generation, enhancing measurement throughput
  • Giant slotted chamber design with generous interior volume, ideal for standard and oversized samples
  • The USB connection allows operation using a standard computer without additional hardware or firmware
  • Made in Germany to the highest engineering standards
  • Robust design for long term reliability
  • Approved by PTB (Physikalisch Technische Bundesanstalt), ensures highest level of radiation safety
Tìm Kiếm
Hỗ trợ trực tuyến
Trụ sở chính TP. HCM:
445 Tô Hiến Thành, P. 14, Quận 10 - Tp.HCM
Điện thoại: (028) 38646051 - 38646116 - 38660978 - 38665363
Fax: (028) 386 444 61
MST: 03 00 972 905
Văn phòng ĐD tại Hà nội:
Số nhà 33, Ngõ 87, Đường Nguyễn Phong Sắc, Cầu Giấy, Hà Nội
Fax: (024) 3565 9336
Điện thoại: (024) 3565 9335