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Coating thickness measurement and materials analysis to improve process and quality control with X-ray fluorescence (XRF)

The X-Strata920 is a compact, rugged and reliable quality control XRF benchtop system for simple, rapid, non-destructive coating thickness measurement and materials analysis.

It performs excellent coating thickness analysis and characterisation of multi-layer analysis across a wide range of industrial markets, including electronics, metal finishing, alloys and precious metals assay.

Hỗ trợ trực tuyến
  • ngocnu13
  • Ms. Nữ - 0902859378
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    Trụ sở chính TP. HCM:
    445 Tô Hiến Thành, P. 14, Quận 10 - Tp.HCM
    Điện thoại: (028) 38646051 - 38646116 - 38660978 - 38665363
    Fax: (028) 386 444 61
    Email: mtse@mythanh.com
    MST: 03 00 972 905
    Văn phòng ĐD tại Hà nội:
    Số nhà 33, Ngõ 87, Đường Nguyễn Phong Sắc, Cầu Giấy, Hà Nội
    Fax: (024) 3565 9336
    Điện thoại: (024) 3565 9335